Abstract: Estimating the reliability of electronic devices involves identification of failure mechanisms and prediction of lifetimes. For parameter estimation and failure mode identification in ...

Final project of the course MATH-517 Statistical Computation and Visualization (EPFL, Fall 2023). The goal of this project is to study the performance of inference using the Expectation Maximization ...

Abstract: To solve the electromagnetic (EM) scattering problems involving a single, complexly moving perfectly electric conductor (PEC) with the traditional adaptive cross approximation-method of ...