Chip reliability is coming under much tighter scrutiny as IC-driven systems take on increasingly critical and complex roles. So whether it’s a stray alpha particle that flips a memory bit, or some ...

UV degradation was among the three most common test failures from Kiwa PVEL’s module testing this year. Image: Kiwa PVEL. As the year comes to a close, there is no doubt that this was the year of ...

http://www.maxwell.comSystem reliability concerns are imperative to the implementation of today's broadband wireless infrastructure. Wireless networks require new ...

The Module Reliability Scorecard, published annually by PV module testing laboratory Kiwa-PVEL, released its 11 th edition today. The scorecard summarizes the results of extended reliability testing ...

Collaboration enables SoC manufacturers to improve their qualification envelope to achieve lifetime reliability, shorten their root cause analysis time, and reduce operational costs HAIFA, ...