Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...

insights from industryDr. Anna WalkiewiczApplications SpecialistQuorum Technologies In this interview, AZoM talks to Anna Walkiewicz, Applications Specialist at Quorum Technologies, about sample ...

Carl Zeiss has launched the AURIGA® Laser, a new advanced system combining the specific advantages of the AURIGA® CrossBeam (FIB-SEM) workstation with the capabilities of a pulsed micro-focus laser ...

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...

Prepare samples by coating, drying, etching, milling, polishing, and sectioning. The Leica CPD 030 Critical Point Dryer is a critical point drying device for biological and industrial samples. It uses ...

Observation of Live Ticks (Haemaphysalis flava) by Scanning Electron Microscopy under High Vacuum Pressure, PLoS One “Scanning electron microscopes (SEM), which image sample surfaces by scanning with ...