Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...
Engineers are beginning to appreciate that, from prototypes early in the design cycle through to final system test, a digital pattern generator (DPG) speeds up system debug and therefore shortens the ...
The eutectic structure of metals and ceramics occurs when multiple solid phases solidify from a liquid phase, forming a three-dimensional (3D) pattern through a self-organizing phenomenon.
Eight New Models Offer Biggest Display Size, Deepest Memory and the Only Pattern Generation Available in a Fixed Configuration PALO ALTO, Calif.—Agilent Technologies Inc. expands its industry-leading ...
The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.
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