Engineers are beginning to appreciate that, from prototypes early in the design cycle through to final system test, a digital pattern generator (DPG) speeds up system debug and therefore shortens the ...

Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Byte Paradigm has released the Wave Generator Xpress, a PC-controlled arbitrary digital waveform generator (pattern generator) on USB. Controlled through a USB 2.0 high-speed interface, this new ...

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...