Surface metrology has become an essential part of any high-tech production line, where extremely precise optical instruments are used to ensure that surface characteristics are up to standard. These ...

General discussion in the metrology field tends to revolve around the relative merits of non-contact or contact measurement solutions. However, demand now exists in almost every industry for more ...

Bruker Corporation has announced the closing of its acquisition of the Atomic Force Microscopy (AFM) and the Optical Industrial Metrology (OIM) instruments businesses from Veeco Instruments, Inc. for ...

Vamsi Velidandla, VP of Marketing for Zeta Instruments, talks to AZoNano about the applications of their unique metrology technology. Tell us about Zeta Instruments and the type of products you ...

SAN JOSE, Calif.--(BUSINESS WIRE)--Zeta Instruments, Inc., announced today that a leading Taiwan based outsourced semiconductor assembly and test (OSAT) ordered its third Zeta-580™ automated metrology ...

ROTTERDAM, Netherlands, July 10, 2023 (GLOBE NEWSWIRE) -- Nearfield Instruments B.V., a provider of ground-breaking process control metrology solutions for advanced semiconductor devices, today ...

ROTTERDAM, The Netherlands, Nov. 18, 2025 (GLOBE NEWSWIRE) -- Nearfield Instruments, the leader in 3D, non-destructive, in-line process control solutions based on scanning probe technology, today ...

(Nanowerk News) A new laser speckle angular measurement (SAM) technique detailed in a paper in Light: Science and Applications, published today demonstrates how slope ...