Advancements in nanotechnology fabrication and characterization tools have facilitated a number of developments in the creation of new two-dimensional (2D) materials and gaining and understanding of ...

Scientists used Lorentz transmission electron microscopy (LTEM) to visualize topological defects. They were able to do so by passing electrons and observing their deflections through a thin magnetic ...

What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

A technical paper titled “Accelerating Defect Predictions in Semiconductors Using Graph Neural Networks” was published by researchers at Purdue University, Indian Institute of Technology (IIT) Madras, ...

There is an expectation from consumers that today’s electronic products will just work and that electronic manufacturers have continued to improve the quality of their products. In most cases, this ...

MILPITAS, Calif.--(BUSINESS WIRE)--Today KLA-Tencor Corporation (NASDAQ:KLAC), the world’s leading supplier of process control and yield management solutions for the semiconductor and related ...

Whether you’re using a leading-edge process node to manufacture a very large system-on-chip (SoC), or using an established node for automotive or Internet of Things (IoT) electronics, critical area ...

The growing demand for Lithium-ion (Li-ion) batteries, driven by applications such as electric vehicles and long-duration energy storage, has increased the pressure on battery manufacturers to enhance ...