Design problems that appear in the late phases of the development cycle can be extremely difficult to track down and debug, thus putting project schedules at risk. It’s not uncommon for an engineer to ...

Congratulations, you have just finished assembling your electronics project. After checking for obvious problems you apply power and… it didn’t do what you wanted. They almost never work on the first ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...