SAN JOSE, Calif., Nov. 9, 2020 /PRNewswire/ -- The Video Electronics Standards Association (VESA ®) today announced that it has sponsored the development of a test tool for high dynamic range (HDR) ...

About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Many mechanical tests of composite materials require the compression loading of a test fixture. These include not only compression test methods, but also many shear, flexure, curved-beam strength, ...