A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

A new AI model generates realistic synthetic microscope images of atoms, providing scientists with reliable training data to accelerate materials research and atomic scale analysis. (Nanowerk ...

In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...

Researchers at Oak Ridge National Laboratory have used specialized tools to study materials at the atomic scale and analyze ...

To manage the energy transition, it will also be important to rapidly develop cheap and efficient materials that can be used to split water or CO 2 by electrocatalysis. In this process, part of the ...

Scientists at Lawrence Berkeley National Laboratory made a big leap in their research into all things small. Within the past few months, scientists there began using what they say is the world’s most ...